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Advanced scanning electron microscopy and X-ray microanalysis /

Advanced scanning electron microscopy and X-ray microanalysis / Dale E. Newbury ... [et al.]. - xii, 454 p. : il. ; 24 cm.

Incluye referencia bibliográfica: p. 435-448 e índice

ISBN: 0306421402

Subjects--Topical Terms:
MICROSCOPIOS DE RAYOS X.
MICROSCOPIOS ELECTRONICOS--BARRIDO.

Dewey Class. No.: 502.825 / A3 1986

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