The nature of dielectric breakdown (Record no. 53376)
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| 000 -LEADER | |
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| fixed length control field | 01492nam a2200193Ia 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | MX-MdCICY |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250625162427.0 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | CICY |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) | |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) | B-19238 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250602s9999 xx |||||s2 |||| ||und|d |
| 245 10 - TITLE STATEMENT | |
| Title | The nature of dielectric breakdown |
| 490 0# - SERIES STATEMENT | |
| Volume/sequential designation | Applied Physics Letters, 93(7), p.072903, 2008 |
| 520 3# - SUMMARY, ETC. | |
| Summary, etc. | Dielectric breakdown is the process of local materials transiting from insulating to conductive when the dielectric is submerged in a high external electric field environment. We show that the atomistic changes of the chemical bonding in a nanoscale breakdown path are extensive and irreversible. Oxygen atoms in dielectric SiO2 are washed out with substoichiometric silicon oxide (SiO?? with ??<2)formation, and local energy gap lowering with intermediate bonding state of silicon atoms (Si1+, Si2+, and Si3+)in the percolation leakage path. Oxygen deficiency within the breakdown path is estimated to be as high as 50 percent -60 percent . We thank G. Zhang and V. L. Lo for technical discussions and sample preparation, and Chartered Semiconductor Manufacturing for providing the samples. This work was supported by Ministry of Education (MOE)Grant Nos. T206B1205 and NTU RGM 33/03. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Li, X. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Tung, C. H. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Pey, K. L. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://drive.google.com/file/d/17DtZHh34GMAHu9A_DhgKUO_HKW8aD5Z2/view?usp=drivesdk">https://drive.google.com/file/d/17DtZHh34GMAHu9A_DhgKUO_HKW8aD5Z2/view?usp=drivesdk</a> |
| Public note | Para ver el documento ingresa a Google con tu cuenta: @cicy.edu.mx |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Clasificación local |
| Koha item type | Documentos solicitados |
| Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection | Home library | Current library | Shelving location | Date acquired | Total checkouts | Full call number | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Clasificación local | Ref1 | CICY | CICY | Documento préstamo interbibliotecario | 25.06.2025 | B-19238 | 25.06.2025 | 25.06.2025 | Documentos solicitados |
