Chemical analysis of tree growth in epoxy resin using AFM-IR spectroscopy (Record no. 53488)

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control field MX-MdCICY
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250625162429.0
040 ## - CATALOGING SOURCE
Transcribing agency CICY
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) B-19356
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245 10 - TITLE STATEMENT
Title Chemical analysis of tree growth in epoxy resin using AFM-IR spectroscopy
490 0# - SERIES STATEMENT
Volume/sequential designation IEEE Transactions on Dielectrics and Electrical Insulation, 27(3), p.773-781, 2020
520 3# - SUMMARY, ETC.
Summary, etc. Recent advances have allowed submicron features of electrical trees to be imaged. Until recently it has not been possible to analyze chemical aging on the same scale. Here, the use of atomic force microscopy - infrared spectroscopy (AFM-IR)to characterize chemical degradation around a needle tip, and in the vicinity of electrical tree branches grown in epoxy resin is explored. The spectral signatures associated with the degradation of epoxies during electrical treeing are successfully identified with 50 nm resolution. This allows identification of chemical degradation in unprecedented detail. The method of polishing and grinding to prepare the samples was found to remove degraded material from exposed channels. This issue was overcome by not fully exposing the tree, but bringing it close enough to the surface that the AFM-IR was able to see within the channel. A short tree examined immediately after initiation showed no chemical degradation, indicating that its growth was not a chemically active process, suggesting electromechanical fracturing is more likely. Mature channels showed no singular chemical signature. Carbonyl groups were identified in all mature channels and were particularly concentrated at the branching points studied, suggesting higher levels of degradation during branching or accumulation at points of bifurcation. It is believed that these reactions are precipitated by hot electron impacts during discharges. AFM-IR has provided unprecedented detail concerning chemical damage incurred during the treeing process and can provide vital information to inform models of aging.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element AFM-IR
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRICAL TREE
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element EPOXY
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CHEMICAL
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CHARACTERIZATION
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element IMAGING
700 12 - ADDED ENTRY--PERSONAL NAME
Personal name Mcdonald, H.
700 12 - ADDED ENTRY--PERSONAL NAME
Personal name Morsch, S.
700 12 - ADDED ENTRY--PERSONAL NAME
Personal name Rowland, S. M.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://drive.google.com/file/d/1fNuVoute2yScXl7Hw3sFJrSb4EH34zc5/view?usp=drivesdk">https://drive.google.com/file/d/1fNuVoute2yScXl7Hw3sFJrSb4EH34zc5/view?usp=drivesdk</a>
Public note Para ver el documento ingresa a Google con tu cuenta: @cicy.edu.mx
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Source of classification or shelving scheme Clasificación local
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  Clasificación local     Ref1 CICY CICY Documento préstamo interbibliotecario 25.06.2025   B-19356 25.06.2025 25.06.2025 Documentos solicitados