MARC details
| 000 -LEADER |
| fixed length control field |
02002nam a2200205Ia 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
| control field |
MX-MdCICY |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20250625162444.0 |
| 040 ## - CATALOGING SOURCE |
| Transcribing agency |
CICY |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
B-20187 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
250602s9999 xx |||||s2 |||| ||und|d |
| 245 10 - TITLE STATEMENT |
| Title |
Interfacial thermal resistance: Past, present, and future |
| 490 0# - SERIES STATEMENT |
| Volume/sequential designation |
Reviews of Modern Physics, 94(2), p.025002, 2022 |
| 520 3# - SUMMARY, ETC. |
| Summary, etc. |
Interfacial thermal resistance (ITR)is the main obstacle for heat flows from one material to another. Understanding ITRbecomes essential for the removal of redundant heat fromfast and powerful electronic and photonic devices, batteries, etc. In this review, a comprehensive examination of ITR is conducted. Particular focus is placed on the theoretical, computational, and experimental developments in the 30 years after the last review given by Swartz and Pohl in 1989. To be self-consistent, the fundamental theories, such as the acoustic mismatch model, the diffuse mismatch model, and the two-temperature model, are reviewed. The most popular computational methods, including lattice dynamics, molecular dynamics, the Green's function method, and the Boltzmann transport equation method, are discussed in detail.Various experimental tools in probing ITR, such as the time-domain thermoreflectance, the thermal bridge method, the 3? method, and the electron-beam self-heating method, are illustrated. This review covers ITR (also known as the thermal boundary resistance or Kapitza resistance)of solid-solid, solidliquid, and solid-gas interfaces. Such fundamental challenges as how to define the interface, temperature, etc.when thematerials scale down to the nanoscale or atomic scale and the opportunities for future studies are also pointed out. |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Chen, J. |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Xu, X. |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Zhou, J. |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Li, B. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
| Uniform Resource Identifier |
<a href="https://drive.google.com/file/d/1p4jGyERKZCB7kOpC0ToBGwxBwIFjaeoG/view?usp=drivesdk">https://drive.google.com/file/d/1p4jGyERKZCB7kOpC0ToBGwxBwIFjaeoG/view?usp=drivesdk</a> |
| Public note |
Para ver el documento ingresa a Google con tu cuenta: @cicy.edu.mx |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Source of classification or shelving scheme |
Clasificación local |
| Koha item type |
Documentos solicitados |