Design and analysis of a carbon nanotube-based strain gauge via multiscale modeling (Record no. 54607)
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| 000 -LEADER | |
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| fixed length control field | 02160nam a2200277Ia 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | MX-MdCICY |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250625162450.0 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | CICY |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) | |
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) | B-20516 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250602s9999 xx |||||s2 |||| ||und|d |
| 245 10 - TITLE STATEMENT | |
| Title | Design and analysis of a carbon nanotube-based strain gauge via multiscale modeling |
| 490 0# - SERIES STATEMENT | |
| Volume/sequential designation | Meccanica, 58(8), p.1717-1732, 2023 |
| 520 3# - SUMMARY, ETC. | |
| Summary, etc. | The gauge factor of strain gauges depends on several factors such as the geometry of the gauge and the piezoresistive properties of the materials used. Herein, the piezoresistive response of a strain gauge comprising a network of carbon nanotubes (CNTs)deposited over a polyimide (Kapton)substrate is theoretically and experimentally investigated. Two computational approaches are used, namely, a continuous finite element model and a multiscale model comprising two dimensional scales. The finite element model is a simplified model which simulates the CNT grid as a continuous solid. The multiscale approach utilizes a resistor network model to simulate the change in electrical resistance of the CNT grid with strain and uses such effective electrical resistance as an input of the finite element model. It is found that the gauge factor increases with increased number of end loops, decreasing grid width, and decreasing the end loop height. Both modeling approaches agree with the observed experimental tendencies. The multiscale approach is more realistic and accounts for effects occurring at the micro and nanoscales, such as electron tunneling. The gauge factors predicted by this model were moderately higher than the measured values, given some idealizations of the model. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | CARBON NANOTUBE DEPOSIT |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | STRAIN GAUGE |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | FINITE ELEMENT |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | MULTISCALE SIMULATION |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | PIEZORESISTIVITY |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | CARBON NANOTUBES |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Arana, G. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Mora, A. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Pérez, I. |
| 700 12 - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Avilés, F. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://drive.google.com/file/d/1vl_yHEzpbznaZFdx-AH3F1lTHHd-cFYR/view?usp=drivesdk">https://drive.google.com/file/d/1vl_yHEzpbznaZFdx-AH3F1lTHHd-cFYR/view?usp=drivesdk</a> |
| Public note | Para ver el documento ingresa a Google con tu cuenta: @cicy.edu.mx |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Clasificación local |
| Koha item type | Documentos solicitados |
| Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection | Home library | Current library | Shelving location | Date acquired | Total checkouts | Full call number | Date last seen | Price effective from | Koha item type |
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| Clasificación local | Ref1 | CICY | CICY | Documento préstamo interbibliotecario | 25.06.2025 | B-20516 | 25.06.2025 | 25.06.2025 | Documentos solicitados |
