Introduction to Advanced System-on-Chip Test Design and Optimization (Record no. 56460)

MARC details
000 -LEADER
fixed length control field 03242nam a22004695i 4500
001 - CONTROL NUMBER
control field 978-0-387-25624-5
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250710083934.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2005 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780387256245
-- 99780387256245
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/b135763
Source of number or code doi
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3
Edition information 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Larsson, Erik.
Relator term author.
245 10 - TITLE STATEMENT
Title Introduction to Advanced System-on-Chip Test Design and Optimization
Medium [recurso electrónico] /
Statement of responsibility, etc. by Erik Larsson.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2005.
300 ## - PHYSICAL DESCRIPTION
Extent XVI, 388 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term recurso en línea
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
490 1# - SERIES STATEMENT
Series statement Frontiers in Electronic Testing,
International Standard Serial Number 0929-1296 ;
Volume/sequential designation 29
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Testing Concepts -- Design Flow -- Design for Test -- Boundary Scan -- SOC Design for Testability -- System Modeling -- Test Conflicts -- Test Power Dissipation -- Test Access Mechanism -- Test Scheduling -- SOC Test Applications -- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling -- An Integrated Framework for the Design and Optimization of SOC Test Solutions -- Efficient Test Solutions for Core-Based Designs -- Core Selection in the SOC Test Design-Flow -- Defect-Aware Test Scheduling -- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint.
520 ## - SUMMARY, ETC.
Summary, etc. SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING DESIGN.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONICS.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element OPTICAL MATERIALS.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONIC AND COMPUTER ENGINEERING.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING DESIGN.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element OPTICAL AND ELECTRONIC MATERIALS.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9781402032073
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Frontiers in Electronic Testing,
International Standard Serial Number 0929-1296 ;
Volume/sequential designation 29
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a>
Public note Ver el texto completo en las instalaciones del CICY
912 ## -
-- ZDB-2-ENG
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Libros electrónicos
Holdings
Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Total checkouts Full call number Date last seen Price effective from Koha item type
  Dewey Decimal Classification     Libro electrónico CICY CICY Libro electrónico 10.07.2025   621.3 10.07.2025 10.07.2025 Libros electrónicos