MARC details
| 000 -LEADER |
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03770nam a22005055i 4500 |
| 001 - CONTROL NUMBER |
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| control field |
978-0-387-74747-7 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20250710084021.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
100301s2008 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780387747477 |
| -- |
99780387747477 |
| 024 7# - OTHER STANDARD IDENTIFIER |
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| Standard number or code |
10.1007/978-0-387-74747-7 |
| Source of number or code |
doi |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
621.3815 |
| Edition information |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Tehranipoor, Mohammad. |
| Relator term |
editor. |
| 245 10 - TITLE STATEMENT |
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| Title |
Emerging Nanotechnologies |
| Medium |
[recurso electrónico] : |
| Remainder of title |
Test, Defect Tolerance, and Reliability / |
| Statement of responsibility, etc. |
edited by Mohammad Tehranipoor. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Boston, MA : |
| Name of producer, publisher, distributor, manufacturer |
Springer US, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2008. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Other physical details |
online resource. |
| 336 ## - CONTENT TYPE |
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| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
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| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
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| Carrier type term |
recurso en línea |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS |
|---|
| File type |
text file |
| Encoding format |
PDF |
| Source |
rda |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Frontiers in Electronic Testing, |
| International Standard Serial Number |
0929-1296 ; |
| Volume/sequential designation |
37 |
| 505 0# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
Test and Defect Tolerance for Crossbar-Based Architectures -- Defect-Tolerant Logic with Nanoscale Crossbar Circuits -- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics -- Test and Defect Tolerance for Reconfigurable Nanoscale Devices -- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology -- Defect Tolerance in Crossbar Array Nano-Architectures -- Test and Defect Tolerance for QCA Circuits -- Reversible and Testable Circuits for Molecular QCA Design -- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems -- QCA Circuits for Robust Coplanar Crossing -- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata -- Testing Microfluidic Biochips -- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems -- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips -- Reliability for Nanotechnology Devices -- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields -- Towards Nanoelectronics Processor Architectures -- Design and Analysis of Fault-Tolerant Molecular Computing Systems. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
ENGINEERING. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
SYSTEM SAFETY. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
COMPUTER ENGINEERING. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
ELECTRONICS. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
SYSTEMS ENGINEERING. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
NANOTECHNOLOGY. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
ENGINEERING. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
CIRCUITS AND SYSTEMS. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
ELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
NANOTECHNOLOGY. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
QUALITY CONTROL, RELIABILITY, SAFETY AND RISK. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
ELECTRICAL ENGINEERING. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
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| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
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| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
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| Relationship information |
Printed edition: |
| International Standard Book Number |
9780387747460 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Frontiers in Electronic Testing, |
| International Standard Serial Number |
0929-1296 ; |
| Volume/sequential designation |
37 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a> |
| Public note |
Ver el texto completo en las instalaciones del CICY |
| 912 ## - |
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| -- |
ZDB-2-ENG |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Libros electrónicos |
