MARC details
| 000 -LEADER |
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| fixed length control field |
04731nam a22004815i 4500 |
| 001 - CONTROL NUMBER |
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| control field |
978-0-387-88136-2 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20251006084428.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr nn 008mamaa |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
101014s2009 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780387881362 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
99780387881362 |
| 024 7# - OTHER STANDARD IDENTIFIER |
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| Standard number or code |
10.1007/978-0-387-88136-2 |
| Source of number or code |
doi |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
620.11 |
| Edition information |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Schwartz, Adam J. |
| Relator term |
editor. |
| 245 10 - TITLE STATEMENT |
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| Title |
Electron Backscatter Diffraction in Materials Science |
| Medium |
[electronic resource] / |
| Statement of responsibility, etc. |
edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
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| Place of production, publication, distribution, manufacture |
Boston, MA : |
| Name of producer, publisher, distributor, manufacturer |
Springer US, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2009. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
XXII, 403 p. |
| Other physical details |
online resource. |
| 336 ## - CONTENT TYPE |
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| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
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| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
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| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS |
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| File type |
text file |
| Encoding format |
PDF |
| Source |
rda |
| 505 0# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
Present State of Electron Backscatter Diffraction and Prospective Developments -- Dynamical Simulation of Electron Backscatter Diffraction Patterns -- Representations of Texture -- Energy Filtering in EBSD -- Spherical Kikuchi Maps and Other Rarities -- Application of Electron Backscatter Diffraction to Phase Identification -- Phase Identification Through Symmetry Determination in EBSD Patterns -- Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM -- Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets -- 3D Reconstruction of Digital Microstructures -- Direct 3D Simulation of Plastic Flow from EBSD Data -- First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds -- Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations -- Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool -- Grain Boundary Networks -- Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections -- Strain Mapping Using Electron Backscatter Diffraction -- Mapping and Assessing Plastic Deformation Using EBSD -- Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques -- Application of EBSD Methods to Severe Plastic Deformation (SPD) and Related Processing Methods -- Applications of EBSD to Microstructural Control in Friction Stir Welding/Processing -- Characterization of Shear Localization and Shock Damage with EBSD -- Texture Separation for ?/? Titanium Alloys -- A Review of In Situ EBSD Studies -- Electron Backscatter Diffraction in Low Vacuum Conditions -- EBSD in the Earth Sciences: Applications, Common Practice, and Challenges -- Orientation Imaging Microscopy in Research on High Temperature Oxidation. |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc. |
Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
PHYSICAL GEOGRAPHY. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
MATERIALS. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
SURFACES (PHYSICS). |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
MATERIALS SCIENCE. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
MATERIALS SCIENCE, GENERAL. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
CONDENSED MATTER PHYSICS. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
GEOPHYSICS/GEODESY. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
CHARACTERIZATION AND EVALUATION OF MATERIALS. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Kumar, Mukul. |
| Relator term |
editor. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Adams, Brent L. |
| Relator term |
editor. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Field, David P. |
| Relator term |
editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
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| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
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| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Printed edition: |
| International Standard Book Number |
9780387881355 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
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| Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/978-0-387-88136-2">http://dx.doi.org/10.1007/978-0-387-88136-2</a> |
| Public note |
Ver el texto completo en las instalaciones del CICY |
| 912 ## - |
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| -- |
ZDB-2-CMS |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Libros electrónicos |
