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06158nam a22005415i 4500 |
| 001 - CONTROL NUMBER |
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978-1-4020-3920-1 |
| 003 - CONTROL NUMBER IDENTIFIER |
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DE-He213 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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20251006084502.0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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cr nn 008mamaa |
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100301s2006 ne | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9781402039201 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
99781402039201 |
| 024 7# - OTHER STANDARD IDENTIFIER |
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| Standard number or code |
10.1007/1-4020-3920-4 |
| Source of number or code |
doi |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
548 |
| Edition information |
23 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Weirich, Thomas E. |
| Relator term |
editor. |
| 245 10 - TITLE STATEMENT |
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| Title |
Electron Crystallography |
| Medium |
[electronic resource] : |
| Remainder of title |
Novel Approaches for Structure Determination of Nanosized Materials / |
| Statement of responsibility, etc. |
edited by Thomas E. Weirich, János L. Lábár, Xiaodong Zou. |
| 246 3# - VARYING FORM OF TITLE |
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| Title proper/short title |
Proceedings of the NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials, Erice, Italy, 10 - 24 June 2004 |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
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| Place of production, publication, distribution, manufacture |
Dordrecht : |
| Name of producer, publisher, distributor, manufacturer |
Springer Netherlands, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2006. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
XVIII, 536 p. |
| Other physical details |
online resource. |
| 336 ## - CONTENT TYPE |
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| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
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| Media type term |
computer |
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c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
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| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 347 ## - DIGITAL FILE CHARACTERISTICS |
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| File type |
text file |
| Encoding format |
PDF |
| Source |
rda |
| 490 1# - SERIES STATEMENT |
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| Series statement |
NATO Science Series II: Mathematics, Physics and Chemistry, |
| International Standard Serial Number |
1568-2609 ; |
| Volume/sequential designation |
211 |
| 505 0# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
What is Electron Crystallography? -- Exploiting Sub-Ångstrom Abilities: -- The Way Forward for Electron Crystallography -- Symmetry and Structure -- Experimental techniques -- to Electron Diffraction -- Symmetry Determinations by Electron Diffraction -- Electron Diffraction Structure Analysis -- Quantitative Electron Diffraction Structure Analysis (EDSA) -- Quantification of Texture Patterns -- Quantitative Convergent Beam Electron Diffraction -- New Instrumentation for TEM Electron Diffraction Structure Analysis: Electron Diffractometry Combined with Beam Precession -- Role of Electron Powder Diffraction in Solving Structures -- Gas-Phase Electron Diffraction for Molecular Structure Determination -- Phase Identification by Combining Local Composition from EDX with Information from Diffraction Database -- Analysis of Local Structure, Chemistry and Bonding by Electron Energy Loss Spectroscopy -- Crystal structure determination from electron microscopy data -- From Fourier Series Towards Crystal Structures -- Crystal Structure Determination by Image Deconvolution and Resolution Enhancement -- Structure Determination from HREM by Crystallographic Image Processing -- 3D Reconstruction of Inorganic Crystals -- Solving and Refining Crystal Structures from Electron Diffraction Data -- The Maximum Entropy Method of Solving Crystal Structures from Electron Diffraction Data -- Structure Refinement by Taking Dynamical Diffraction into Account -- TrueImage -- Applications -- New Insights into the Nanoworld of Functional Materials -- Electron Crystallography on Polymorphs -- Electron Crystallography in Mineralogy and Materials Science -- Structures of Zeolites and Mesoporous Crystals Determined by Electron Diffraction and High-resolution Electron Microscopy -- Hrtem Investigation of Nanocrystalline Materials -- Electron Crystallography on Beam Sensitive Materials -- Characterisation of Catalysts by Transmission Electron Microscopy -- Extended abstracts -- Structural Investigations of Cold Worked Iron Based Alloys after Nitriding -- Structural Refinement of Nanocrystalline TiO2 Samples -- Relation between Magnetic Properties and the Structure of Iron-based Amorphous Alloys Determined by Electron Diffraction -- Selected Issues in Quantitative Structure Analysis of Nanocrystalline Alloys -- Charge Ordering and Tilt Modulation in Multiferroic Fluorides with TTB Structure by Electron Diffraction and Single Crystal XRD -- Electron Diffraction by Distorted Nanocrystals -- Electron Microscopy Investigations of Glassy-Like Carbon -- Image Deconvolution on Crystals with Interfaces -- Crystal Structure Determination by Maximum Entropy Image Deconvolution in Combination with Image Simulation. |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc. |
During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. Moreover, these developments have been accompanied by a now available new generation of computer controlled electron microscopes equipped with high-coherent field-emission sources, cryo-specimen holders, ultra-fast CCD cameras, imaging plates, energy filters and even correctors for electron optical distortions. Thus, a fast and semi-automatic data acquisition from small sample areas, similar to what we today know from imaging plates diffraction systems in X-ray crystallography, can be envisioned for the very near future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous recent achievements, this NATO Advanced Study Institute was devoted to the novel approaches of electron crystallography for structure determination of nanosized materials. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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PHYSICS. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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CATALYSIS. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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MINERALOGY. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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CRYSTALLOGRAPHY. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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SURFACES (PHYSICS). |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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PHYSICS. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
CRYSTALLOGRAPHY. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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CHARACTERIZATION AND EVALUATION OF MATERIALS. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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SURFACES AND INTERFACES, THIN FILMS. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
MINERALOGY. |
| 650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
CATALYSIS. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Lábár, János L. |
| Relator term |
editor. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Zou, Xiaodong. |
| Relator term |
editor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
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| Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
| 773 0# - HOST ITEM ENTRY |
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| Title |
Springer eBooks |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
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| Relationship information |
Printed edition: |
| International Standard Book Number |
9781402039188 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
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| Uniform title |
NATO Science Series II: Mathematics, Physics and Chemistry, |
| International Standard Serial Number |
1568-2609 ; |
| Volume/sequential designation |
211 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
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| Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/1-4020-3920-4">http://dx.doi.org/10.1007/1-4020-3920-4</a> |
| Public note |
Ver el texto completo en las instalaciones del CICY |
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ZDB-2-PHA |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Libros electrónicos |
