Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; foreward by T.E. Evenhart

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Tipo de material: Texto

TextoEditor: New York : Plenum Press, 1975Descripción: xvii, 582 p. : il. ; 22 cmISBN:

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Libros impresos	CICY Colección general	Colección general	502.825 G64p (Browse shelf(Opens below))	Available		1585

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