Scanning and transmission electron microscopy : an introduction / Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens
Tipo de material:
TextoEditor: New York : Oxford University Press, 1993Descripción: viii, 225 p. : il. ; 26 cmISBN: - 0195107519 (acidfree paper)
- Heckman, John W. , Jr [coaut.]
- Klomparens, Karen L [coaut.]
- 502.825 F5 1993
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Libros impresos
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CICY Colección general | Colección general | 502.825 F5 1993 (Browse shelf(Opens below)) | Available | 6342 |
Publicado originalmente por: New York : W.H. Freeman, c1993
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