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Influence of residual stresses on the mechanical properties of TiCxN1-x (x= 0, 0.15, 0.45) thin films deposited by arc evaporation

Tipo de material: TextoTextoSeries ; Thin Solid Films, 371(1-2), p.167-177, 2000Trabajos contenidos:
  • Karlsson, L
  • Hultman, L
  • Sundgren, J.E
Tema(s): Recursos en línea:
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Item type Current library Collection Call number Status Date due Barcode
Documentos solicitados Documentos solicitados CICY Documento préstamo interbibliotecario Ref1 B-12564 (Browse shelf(Opens below)) Available

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