Development of a pattern to measure multiscale deformation and strain distribution via in situ FE-SEM observations
Tipo de material:
TextoSeries ; Nanotechnology, 22(11), p.115704, 2011Trabajos contenidos: - Tanaka, Y
- Naito, K
- Kishimoto, S
- Kagawa, Y
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We investigated a method for measuring deformation and strain distribution in a multiscale range from nanometers to millimeters via in situ FE-SEM observations. A multiscale pattern composed of a grid as well as random and nanocluster patterns was developed to measure the localized deformation at the specimen surface. Our in situ observations of a carbon fiber-reinforced polymer matrix composite with a hierarchical microstructure subjected to loading were conducted to identify local deformation behaviors at various boundaries. We measured and analyzed the multiscale deformation and strain localizations during various stages of loading.
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