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Experimental investigations of semi-crystalline plasma polymerized polypyrrole for surface coating

Tipo de material: TextoTextoSeries ; Progress in Organic Coatings, 69(4), p.396-401, 2010Trabajos contenidos:
  • Dhillon, A
  • Kaur, A
  • Srivastava, A. K
  • Avasthi, D. K
Tema(s): Recursos en línea: Resumen: Plasma polymerized thin film of conducting polypyrrole were deposited at room temperature by plasma enhanced chemical vapor deposition method using pyrrole monomer as precursor. The radio frequency (RF: 13.56 MHz, power supply: 30 W)was applied at constant argon gas pressure for the formation of plasma. The as grown thin films of polypyrrole have been characterized by ellipsometry, Fourier transform infrared spectroscopy (FTIR), UV-vis spectroscopy, atomic force microscopy (AFM), X-ray diffractometry (XRD)and high-resolution transmission electron microscopy (HRTEM). UV-vis spectra showed the optical energy band gap of 2.3 eV. XRD pattern of plasma polymerized polypyrrole has revealed a clear peak at inter-planer separation of 0.687 nm. It was also noticed by HRTEM analysis that the distinguished reflection at d = 0.687 nm has a broadening effect that may be correlated with the crystallinity of the material.
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Plasma polymerized thin film of conducting polypyrrole were deposited at room temperature by plasma enhanced chemical vapor deposition method using pyrrole monomer as precursor. The radio frequency (RF: 13.56 MHz, power supply: 30 W)was applied at constant argon gas pressure for the formation of plasma. The as grown thin films of polypyrrole have been characterized by ellipsometry, Fourier transform infrared spectroscopy (FTIR), UV-vis spectroscopy, atomic force microscopy (AFM), X-ray diffractometry (XRD)and high-resolution transmission electron microscopy (HRTEM). UV-vis spectra showed the optical energy band gap of 2.3 eV. XRD pattern of plasma polymerized polypyrrole has revealed a clear peak at inter-planer separation of 0.687 nm. It was also noticed by HRTEM analysis that the distinguished reflection at d = 0.687 nm has a broadening effect that may be correlated with the crystallinity of the material.

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