Science of Microscopy [recurso electrónico] / edited by Peter W. Hawkes, John C. H. Spence.

Imaging With Electrons -- Atomic Resolution Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Electron Microscopy -- Analytical Electron Microscopy -- High-Speed Electron Microscopy -- In Situ Transmission Electron Microscopy -- Cryoelectron Tomography (CET) -- LEEM and SPLEEM -- Photoemission Electron Microscopy (PEEM) -- Aberration Correction -- Imaging With Photons -- Two-Photon Excitation Fluorescence Microscopy -- Nanoscale Resolution in Far-Field Fluorescence Microscopy -- Principles and Applications of Zone Plate X-Ray Microscopes -- Near-Field Scanning Probes -- Scanning Probe Microscopy in Materials Science -- Scanning Tunneling Microscopy in Surface Science -- Atomic Force Microscopy in the Life Sciences -- Low-Temperature Scanning Tunneling Microscopy -- Holographic And Lensless Modes -- Electron Holography -- Diffractive (Lensless) Imaging -- The Notion of Resolution.

New forms of imaging in science have nearly always led to major advances, especially at the nanoscale, and the pace of these developments has increased dramatically in recent decades. Many new types of microscopes have joined the traditional light microscope and the transmission and scanning electron microscopes during the past two decades. In the present volumes, a group of experts present comprehensive reviews of these new instruments and new versions of the older ones as well as associated techniques and draw attention to their principal areas of application. Numerous subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. Science of Microscopy will be an indispensable guide to a wide range of scientists in university laboratories as well as to engineers and scientists in industrial R&D departments.