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Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.

Por: Colaborador(es): Tipo de material: TextoTextoSeries Frontiers in Electronic Testing ; 36Editor: Dordrecht : Springer Netherlands, 2006Descripción: XV, 452 p. online resourceTipo de contenido:
  • text
Tipo de medio:
  • computer
Tipo de soporte:
  • online resource
ISBN:
  • 9781402053153
  • 99781402053153
Tema(s): Formatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD:
  • 621.3815 23
Recursos en línea:
Contenidos:
Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.
En: Springer eBooksResumen: Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
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Libros electrónicos Libros electrónicos CICY Libro electrónico Libro electrónico 621.3815 (Browse shelf(Opens below)) Available

Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

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