Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico / R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Tipo de material:
TextoEditor: Bellingham, Wash. : SPIE, c2005Descripción: xx, 852 p. : il. ; 28 cmISBN: - 0819457574
- Mendoza-Santoyo, F [ed.]
- Rodriguez-Vera, R [ed.]
- Centro de Investigaciones en Optica (León, Guanajuato, Mexico)
- International Measurement Confederation. Technical Committee on Measurement of Geometrical Quantities
- Society of Photo-optical Instrumentation Engineers
- 621.366 I5 2005
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Libros impresos
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CICY Colección general | Colección general | 621.366 I5 2005 (Browse shelf(Opens below)) | Available | 7185 |
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