TY  - BOOK
AU  - Goldstein,Joseph I
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 0306472929
U1  - 502.825 
PY  - 2003///
CY  - New York, NY
PB  - Kluwer Academic/Plenum Publishers, 
KW  - MICROSCOPIOS DE RAYOS X
KW  - MICROSCOPIOS ELECTRONICOS
KW  - BARRIDO
N1  - Incluye referencias bibliográficas e índice
N2  - This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed
UR  - https://www.cicy.mx/sitios/sib/doctoelectronico/4516.pdf
ER  -