TY  - BOOK
AU  - Pooja Bohra
AU  - Ajit Arun Waman
AU  - Umesha Konana
AU  - Sathyanarayana Bangalore
AU  - Narayanappa
AU  - Chandrashekar Shivapur Channegowda
AU  - Divya Ballalasamudra Lakshmipathi
TI  - In search of commercially acceptable Panama wilt-resistant natural variants in Ney Poovan banana (Musa AB)
KW  - DETACHED LEAF CHALLENGING
KW  - FUSARIUMWILT
KW  - PRODUCTIVITY INDEX
KW  - SPONTANEOUS VARIANTS
KW  - VARIABILITY
N2  - Ney Poovan banana, the most widely cultivated mixeddiploid banana, has been reported to be susceptible toFusariumwilt like many other varieties in the world. The identification of natural variants possessing disease tolerance or resistance is one strategy to prevent losses. The aim of this study was to identifyresistant lines in Ney Poovan banana, through extensive field surveys and screening of putative variants using a detached leaf-based challenging technique. The selected lines were screened under field condition to determine their economic feasibility for commercial-scale use. A total of 26 lines were observed to be resistant to the disease, out of which 24 exhibited a commercially acceptable productivity index and five best lines possessing desirable attributes were obtained
UR  - https://drive.google.com/file/d/1XcLewFqgAFYwszYYH93ocaYk-XTM6ch5/view?usp=drivesdk
ER  -