TY  - BOOK
AU  - Kalinin,Sergei
AU  - Gruverman,Alexei
ED  - SpringerLink (Online service)
TI  - Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale 
SN  - 9780387286686
PY  - 2007///
CY  - New York, NY
PB  - Springer New York
KW  - CHEMISTRY
KW  - MICROSCOPY
KW  - PARTICLES (NUCLEAR PHYSICS)
KW  - MECHANICAL ENGINEERING
KW  - NANOTECHNOLOGY
KW  - SURFACES (PHYSICS)
KW  - CHARACTERIZATION AND EVALUATION OF MATERIALS
KW  - SURFACES AND INTERFACES, THIN FILMS
KW  - BIOLOGICAL MICROSCOPY
KW  - SOLID STATE PHYSICS AND SPECTROSCOPY
N1  - SPM Techniques for Electrical Characterization -- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Principles of Kelvin Probe Force Microscopy -- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Principles of Near-Field Microwave Microscopy -- Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Electrochemical SPM -- Near-Field High-Frequency Probing -- Electrical and Electromechanical Imaging at the Limits of Resolution -- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors -- Spin-Polarized Scanning Tunneling Microscopy -- Scanning Probe Measurements of Electron Transport in Molecules -- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Theory of Scanning Probe Microscopy -- Multi-Probe Scanning Tunneling Microscopy -- Dynamic Force Microscopy and Spectroscopy in Vacuum -- Scanning Tunneling Microscopy and Spectroscopy of Manganites -- Electrical SPM Characterization of Materials and Devices -- Scanning Voltage Microscopy -- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Electromechanical Behavior in Biological Systems at the Nanoscale -- Scanning Capacitance Microscopy -- Kelvin Probe Force Microscopy of Semiconductors -- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Electron Flow Through Molecular Structures -- Electrical Characterization of Perovskite Nanostructures by SPM -- SPM Measurements of Electric Properties of Organic Molecules -- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Electrical Nanofabrication -- Electrical SPM-Based Nanofabrication Techniques -- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- UHV-STM Nanofabrication on Silicon -- Ferroelectric Lithography -- Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Resistive Probe Storage: Read/Write Mechanism
N2  - Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography
UR  - http://dx.doi.org/10.1007/978-0-387-28668-6
ER  -