TY  - BOOK
AU  - Sánchez,Gloria Huertas
AU  - García de la Vega,Diego Vázquez
AU  - Rueda,Adoración Rueda
AU  - Díaz,José Luis Huertas
ED  - SpringerLink (Online service)
TI  - Oscillation-Based Test in Mixed-Signal Circuits
T2  - Frontiers in Electronic Testing,
SN  - 9781402053153
U1  - 621.3815 23
PY  - 2006///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - ENGINEERING
KW  - ENGINEERING DESIGN
KW  - ELECTRONICS
KW  - SYSTEMS ENGINEERING
KW  - CIRCUITS AND SYSTEMS
KW  - ELECTRONIC AND COMPUTER ENGINEERING
KW  - ELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION
N1  - Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation
N2  - Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits
UR  - http://dx.doi.org/10.1007/1-4020-5315-0
ER  -