Eighth International Symposium on Laser Metrology :  macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico / 
R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering 
 - xx, 852 p. :  il. ;  28 cm. 
<br/><br/>Incluye referencias bibliográficas 
<br/><br/><label>ISBN: </label>0819457574 
<br/><br/><label>Subjects--Topical Terms: </label><br/>LASER--APLICACION EN LA INDUSTRIA--CONGRESOS, CONFERENCIAS, ETC.<br/>MEDICIONES OPTICAS--APLICACION EN LA INDUSTRIA--CONGRESOS, CONFERENCIAS, ETC.<br/>METROLOGIA--CONGRESOS, CONFERENCIAS, ETC.
<br/><br/><label>Dewey Class. No.: </label>621.366  / I5 2005