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Scanning Probe Microscopy [recurso electrónico] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.

Por: Colaborador(es): Tipo de material: TextoTextoSeries NanoScience and TechnologyEditor: New York, NY : Springer New York, 2006Descripción: XIV, 281 p. 116 illus. online resourceTipo de contenido:
  • text
Tipo de medio:
  • computer
Tipo de soporte:
  • recurso en línea
ISBN:
  • 9780387372310
  • 99780387372310
Tema(s): Formatos físicos adicionales: Printed edition:: Sin títuloRecursos en línea:
Contenidos:
The Physics of Scanning Probe Microscopes -- SPM: The Instrument -- Theory of Forces -- Electron Transport Theory -- Transport in the Low Conductance Regime -- Bringing Theory to Experiment in SFM -- Topographic images -- Single-Molecule Chemistry -- Current and Force Spectroscopy -- Outlook.
En: Springer eBooksResumen: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
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Item type Current library Collection Call number Status Date due Barcode
Libros electrónicos Libros electrónicos CICY Libro electrónico Libro electrónico Available

The Physics of Scanning Probe Microscopes -- SPM: The Instrument -- Theory of Forces -- Electron Transport Theory -- Transport in the Low Conductance Regime -- Bringing Theory to Experiment in SFM -- Topographic images -- Single-Molecule Chemistry -- Current and Force Spectroscopy -- Outlook.

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

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