000			01489nam a2200253Ia 4500
001			000004516
003			MX-MdCICY
005			20241009163732.0
008			300314t----2003nyua###f#p---#000-0#ENG-#
020			_a0306472929
040			_cCICY
082	0	4	_a502.825 _bS2 2003
245	1	0	_aScanning electron microscopy and x-ray microanalysis / _cJoseph I. Goldstein ... [et al.]
250			_a3 ed.
264	3	1	_aNew York, NY : _bKluwer Academic/Plenum Publishers, _c2003
300			_axix, 689 p. : _bil. ; _c26 cm. + 1 CD-ROM (4 3/4 pulgadas)
504			_aIncluye referencias bibliográficas e índice
520	3		_aThis text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
650	1	4	_aMICROSCOPIOS DE RAYOS X
650	1	4	_aMICROSCOPIOS ELECTRONICOS _xBARRIDO
700	1	2	_aGoldstein, Joseph I
856	4	0	_uhttps://www.cicy.mx/sitios/sib/doctoelectronico/4516.pdf _zVer tabla de contenido y/o resumen
942			_2ddc _cBK
999			_c4468 _d4468