| 000 | 00847nam a2200241Ia 4500 | ||
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| 003 | MX-MdCICY | ||
| 005 | 20260109124649.0 | ||
| 008 | 250602s9999 xx |||||s2 |||| ||und|d | ||
| 040 | _cCICY | ||
| 090 | _aB-12564 | ||
| 245 | 1 | 0 | _aInfluence of residual stresses on the mechanical properties of TiCxN1-x (x= 0, 0.15, 0.45) thin films deposited by arc evaporation |
| 490 | 0 | _vThin Solid Films, 371(1-2), p.167-177, 2000 | |
| 650 | 1 | 4 | _aRESIDUAL STRESS |
| 650 | 1 | 4 | _aTHIN FILMS |
| 650 | 1 | 4 | _aARC EVAPORATION |
| 650 | 1 | 4 | _aTITANIUM CARBONITRIDE |
| 650 | 1 | 4 | _aHARDNESS |
| 700 | 1 | 2 | _aKarlsson, L. |
| 700 | 1 | 2 | _aHultman, L. |
| 700 | 1 | 2 | _aSundgren, J.E. |
| 856 | 4 | 0 |
_uhttps://drive.google.com/file/d/18SIAP77xOr63q5Epm4aDKhc0gN9GShuG/view?usp=drivesdk _zPara ver el documento ingresa a Google con tu cuenta: @cicy.edu.mx |
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