000			04222nam a22004935i 4500
001			978-0-387-25743-3
003			DE-He213
005			20250710083934.0
007			cr nn 008mamaa
008			100301s2005 xxu| s |||| 0|eng d
020			_a9780387257433 _a99780387257433
024	7		_a10.1007/b135977 _2doi
082	0	4	_a621.3815 _223
100	1		_aKabisatpathy, Prithviraj. _eauthor.
245	1	0	_aFault Diagnosis of Analog Integrated Circuits _h[recurso electrónico] / _cby Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha.
264		1	_aBoston, MA : _bSpringer US, _c2005.
300			_aIX, 182 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aFrontiers in Electronic Testing, _x0929-1296 ; _v30
505	0		_aIntroduction. Basic test issues. Introduction. A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme. Introduction. The diagnosis procedure. The test stimulus generation. The fault modelling. Approximation modelling of the analogue integrated circuits. Artificial neural networks: an overview. Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained -- Fault Diagnosis in Embedded Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology. Introduction. The hardware realisation. Experimental results. Discussion on the results obtained -- Conclusions. Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.
520			_aSystem on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort. Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
650		0	_aENGINEERING.
650		0	_aENGINEERING DESIGN.
650		0	_aELECTRONICS.
650		0	_aSYSTEMS ENGINEERING.
650	1	4	_aENGINEERING.
650	2	4	_aCIRCUITS AND SYSTEMS.
650	2	4	_aENGINEERING DESIGN.
650	2	4	_aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650	2	4	_aELECTRONIC AND COMPUTER ENGINEERING.
700	1		_aBarua, Alok. _eauthor.
700	1		_aSinha, Satyabroto. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387257426
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v30
856	4	0	_uhttp://dx.doi.org/10.1007/b135977 _zVer el texto completo en las instalaciones del CICY
912			_aZDB-2-ENG
942			_2ddc _cER
999			_c56474 _d56474