000			03662nam a22005295i 4500
001			978-0-387-25903-1
003			DE-He213
005			20250710083935.0
007			cr nn 008mamaa
008			100301s2005 xxu| s |||| 0|eng d
020			_a9780387259031 _a99780387259031
024	7		_a10.1007/b136458 _2doi
082	0	4	_a621.3815 _223
100	1		_aDallet, Dominique. _eauthor.
245	1	0	_aDynamic Characterisation of Analogue-to-Digital Converters _h[recurso electrónico] / _cby Dominique Dallet, José Machado Silva.
264		1	_aBoston, MA : _bSpringer US, _c2005.
300			_aXX, 280 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aThe International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, _x0893-3405 ; _v860
505	0		_aADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measurement -- Hysteresis Measurement.
520			_aThe Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs' dynamic performance behaviour using sinusoidal stimuli. The three classical methods - histogram, sine wave fitting, and spectral analysis - are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
650		0	_aENGINEERING.
650		0	_aWEIGHTS AND MEASURES.
650		0	_aENGINEERING DESIGN.
650		0	_aMICROWAVES.
650		0	_aELECTRONICS.
650		0	_aSYSTEMS ENGINEERING.
650	1	4	_aENGINEERING.
650	2	4	_aCIRCUITS AND SYSTEMS.
650	2	4	_aELECTRONIC AND COMPUTER ENGINEERING.
650	2	4	_aENGINEERING DESIGN.
650	2	4	_aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650	2	4	_aMICROWAVES, RF AND OPTICAL ENGINEERING.
650	2	4	_aMEASUREMENT SCIENCE, INSTRUMENTATION.
700	1		_aSilva, José Machado. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387259024
830		0	_aThe International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, _x0893-3405 ; _v860
856	4	0	_uhttp://dx.doi.org/10.1007/b136458 _zVer el texto completo en las instalaciones del CICY
912			_aZDB-2-ENG
942			_2ddc _cER
999			_c56506 _d56506