000 02508nam a22004575i 4500
001 978-0-387-26528-5
003 DE-He213
005 20250710083936.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 _a9780387265285
_a99780387265285
024 7 _a10.1007/b137645
_2doi
082 0 4 _a621.3815
_223
100 1 _aSrivastava, Ashish.
_eauthor.
245 1 0 _aStatistical Analysis and Optimization for VLSI: Timing and Power
_h[recurso electrónico] /
_cby Ashish Srivastava, Dennis Sylvester, David Blaauw.
264 1 _aBoston, MA :
_bSpringer US,
_c2005.
300 _aIX, 279 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSeries on Integrated Circuits and Systems
505 0 _aStatistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques.
520 _aStatistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.
650 0 _aENGINEERING.
650 0 _aELECTRONICS.
650 0 _aSYSTEMS ENGINEERING.
650 1 4 _aENGINEERING.
650 2 4 _aCIRCUITS AND SYSTEMS.
650 2 4 _aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
700 1 _aSylvester, Dennis.
_eauthor.
700 1 _aBlaauw, David.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387257389
830 0 _aSeries on Integrated Circuits and Systems
856 4 0 _uhttp://dx.doi.org/10.1007/b137645
_zVer el texto completo en las instalaciones del CICY
912 _aZDB-2-ENG
942 _2ddc
_cER
999 _c56580
_d56580