000			03188nam a22004935i 4500
001			978-0-387-34609-0
003			DE-He213
005			20250710083954.0
007			cr nn 008mamaa
008			100301s2006 xxu| s |||| 0|eng d
020			_a9780387346090 _a99780387346090
024	7		_a10.1007/0-387-34609-0 _2doi
082	0	4	_a621.3815 _223
100	1		_aSilva, Francisco. _eauthor.
245	1	4	_aThe Core Test Wrapper Handbook _h[recurso electrónico] : _bRationale and Application of IEEE Std. 1500™ / _cby Francisco Silva, Teresa McLaurin, Tom Waayers.
264		1	_aBoston, MA : _bSpringer US, _c2006.
300			_aXXIX, 276 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aFrontiers in Electronic Testing, _x0929-1296 ; _v35
505	0		_aWhat is the IEEE 1500 Standard? -- Why use the IEEE 1500 Standard? -- Illustration Example -- Design of the IEEE 1500 Interface Port -- Instruction Types -- Design of the WBR -- Design of the WBY -- Design of the WIR -- Hierarchical Cores -- Finalizing the Wrapper Solution for the EX Core -- SOC Integration of 1500 Compliant Cores.
520			_aThe Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the design of this IEEE standard conceived to enable efficient core test reuse and debug at the SOC level. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.
650		0	_aENGINEERING.
650		0	_aCOMPUTER AIDED DESIGN.
650		0	_aELECTRONICS.
650		0	_aSYSTEMS ENGINEERING.
650	1	4	_aENGINEERING.
650	2	4	_aCIRCUITS AND SYSTEMS.
650	2	4	_aCOMPUTER-AIDED ENGINEERING (CAD, CAE) AND DESIGN.
650	2	4	_aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650	2	4	_aELECTRONIC AND COMPUTER ENGINEERING.
700	1		_aMcLaurin, Teresa. _eauthor.
700	1		_aWaayers, Tom. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387307510
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v35
856	4	0	_uhttp://dx.doi.org/10.1007/0-387-34609-0 _zVer el texto completo en las instalaciones del CICY
912			_aZDB-2-ENG
942			_2ddc _cER
999			_c57390 _d57390