000			03770nam a22005055i 4500
001			978-0-387-74747-7
003			DE-He213
005			20250710084021.0
007			cr nn 008mamaa
008			100301s2008 xxu| s |||| 0|eng d
020			_a9780387747477 _a99780387747477
024	7		_a10.1007/978-0-387-74747-7 _2doi
082	0	4	_a621.3815 _223
100	1		_aTehranipoor, Mohammad. _eeditor.
245	1	0	_aEmerging Nanotechnologies _h[recurso electrónico] : _bTest, Defect Tolerance, and Reliability / _cedited by Mohammad Tehranipoor.
264		1	_aBoston, MA : _bSpringer US, _c2008.
300			_bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aFrontiers in Electronic Testing, _x0929-1296 ; _v37
505	0		_aTest and Defect Tolerance for Crossbar-Based Architectures -- Defect-Tolerant Logic with Nanoscale Crossbar Circuits -- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics -- Test and Defect Tolerance for Reconfigurable Nanoscale Devices -- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology -- Defect Tolerance in Crossbar Array Nano-Architectures -- Test and Defect Tolerance for QCA Circuits -- Reversible and Testable Circuits for Molecular QCA Design -- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems -- QCA Circuits for Robust Coplanar Crossing -- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata -- Testing Microfluidic Biochips -- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems -- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips -- Reliability for Nanotechnology Devices -- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields -- Towards Nanoelectronics Processor Architectures -- Design and Analysis of Fault-Tolerant Molecular Computing Systems.
520			_aEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
650		0	_aENGINEERING.
650		0	_aSYSTEM SAFETY.
650		0	_aCOMPUTER ENGINEERING.
650		0	_aELECTRONICS.
650		0	_aSYSTEMS ENGINEERING.
650		0	_aNANOTECHNOLOGY.
650	1	4	_aENGINEERING.
650	2	4	_aCIRCUITS AND SYSTEMS.
650	2	4	_aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650	2	4	_aNANOTECHNOLOGY.
650	2	4	_aQUALITY CONTROL, RELIABILITY, SAFETY AND RISK.
650	2	4	_aELECTRICAL ENGINEERING.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387747460
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v37
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-74747-7 _zVer el texto completo en las instalaciones del CICY
912			_aZDB-2-ENG
942			_2ddc _cER
999			_c58629 _d58629