| 000 | 02636nam a22005175i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4020-5315-3 | ||
| 003 | DE-He213 | ||
| 005 | 20251006084520.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2006 ne | s |||| 0|eng d | ||
| 020 | _a9781402053153 | ||
| 020 | _a99781402053153 | ||
| 024 | 7 |
_a10.1007/1-4020-5315-0 _2doi |
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| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aSánchez, Gloria Huertas. _eauthor. |
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| 245 | 1 | 0 |
_aOscillation-Based Test in Mixed-Signal Circuits _h[electronic resource] / _cby Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. |
| 264 | 1 |
_aDordrecht : _bSpringer Netherlands, _c2006. |
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| 300 |
_aXV, 452 p. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 490 | 1 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v36 |
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| 505 | 0 | _aOscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation. | |
| 520 | _aOscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits. | ||
| 650 | 0 | _aENGINEERING. | |
| 650 | 0 | _aENGINEERING DESIGN. | |
| 650 | 0 | _aELECTRONICS. | |
| 650 | 0 | _aSYSTEMS ENGINEERING. | |
| 650 | 1 | 4 | _aENGINEERING. |
| 650 | 2 | 4 | _aCIRCUITS AND SYSTEMS. |
| 650 | 2 | 4 | _aELECTRONIC AND COMPUTER ENGINEERING. |
| 650 | 2 | 4 | _aENGINEERING DESIGN. |
| 650 | 2 | 4 | _aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION. |
| 700 | 1 |
_aGarcía de la Vega, Diego Vázquez. _eauthor. |
|
| 700 | 1 |
_aRueda, Adoración Rueda. _eauthor. |
|
| 700 | 1 |
_aDíaz, José Luis Huertas. _eauthor. |
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| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781402053146 |
| 830 | 0 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v36 |
|
| 856 | 4 | 0 |
_uhttp://dx.doi.org/10.1007/1-4020-5315-0 _zVer el texto completo en las instalaciones del CICY |
| 912 | _aZDB-2-ENG | ||
| 942 |
_2ddc _cER |
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_c61224 _d61224 |
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