000			02973nam a22005055i 4500
001			978-1-4020-5646-8
003			DE-He213
005			20251006084523.0
007			cr nn 008mamaa
008			100301s2007 ne | s |||| 0|eng d
020			_a9781402056468
020			_a99781402056468
024	7		_a10.1007/978-1-4020-5646-8 _2doi
082	0	4	_a621.3815 _223
100	1		_aVELAZCO, RAOUL. _eeditor.
245	1	0	_aRadiation Effects on Embedded Systems _h[electronic resource] / _cedited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.
264		1	_aDordrecht : _bSpringer Netherlands, _c2007.
300			_aVIII, 269 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aRadiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.
520			_aRadiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today's applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
650		0	_aENGINEERING.
650		0	_aELECTRONICS.
650		0	_aSYSTEMS ENGINEERING.
650		0	_aNUCLEAR ENGINEERING.
650		0	_aENVIRONMENTAL PROTECTION.
650	1	4	_aENGINEERING.
650	2	4	_aCIRCUITS AND SYSTEMS.
650	2	4	_aEFFECTS OF RADIATION/RADIATION PROTECTION.
650	2	4	_aELECTRONIC AND COMPUTER ENGINEERING.
650	2	4	_aELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650	2	4	_aNUCLEAR ENGINEERING.
700	1		_aFOUILLAT, PASCAL. _eeditor.
700	1		_aREIS, RICARDO. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781402056451
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4020-5646-8 _zVer el texto completo en las instalaciones del CICY
912			_aZDB-2-ENG
942			_2ddc _cER
999			_c61372 _d61372