Leakage in Nanometer CMOS Technologies (Record no. 56779)

MARC details
000 -LEADER
fixed length control field 03616nam a22005295i 4500
001 - CONTROL NUMBER
control field 978-0-387-28133-9
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250710083940.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2006 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780387281339
-- 99780387281339
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/0-387-28133-9
Source of number or code doi
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition information 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Narendra, Siva G.
Relator term author.
245 10 - TITLE STATEMENT
Title Leakage in Nanometer CMOS Technologies
Medium [recurso electrónico] /
Statement of responsibility, etc. by Siva G. Narendra, Anantha Chandrakasan.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boston, MA :
Name of producer, publisher, distributor, manufacturer Springer US,
Date of production, publication, distribution, manufacture, or copyright notice 2006.
300 ## - PHYSICAL DESCRIPTION
Extent X, 307 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term recurso en línea
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
490 1# - SERIES STATEMENT
Series statement Series on Integrated Circuits and Systems,
International Standard Serial Number 1558-9412
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Taxonomy of Leakage: Sources, Impact, and Solutions -- Leakage Dependence on Input Vector -- Power Gating and Dynamic Voltage Scaling -- Methodologies for Power Gating -- Body Biasing -- Process Variation and Adaptive Design -- Memory Leakage Reduction -- Active Leakage Reduction and Multi-Performance Devices -- Impact of Leakage Power and Variation on Testing -- Case Study: Leakage Reduction in Hitachi/Renesas Microprocessors -- Case Study: Leakage Reduction in the Intel Xscale Microprocessor -- Transistor Design to Reduce Leakage.
520 ## - SUMMARY, ETC.
Summary, etc. The goal of Leakage in Nanometer CMOS Technologies is to provide ample detail so that the reader can understand why leakage power components are becoming increasingly relevant in CMOS systems that use nanometer scale MOS devices. Leakage current sources at the MOS device level including sub-threshold and different types of tunneling are discussed in detail. The book covers promising solutions at the device, circuit, and architecture levels of abstraction. Manifestation of these MOS device leakage components at the full chip level depends considerably on several aspects including the nature of the circuit block, its state, its application workload, and Process/Voltage/Temperature conditions. The sensitivity of the various MOS leakage sources to these conditions are described from the first principles. The resulting manifestations are discussed at length to help the reader understand the effectiveness of leakage power reduction solutions under these different conditions. Case studies are presented to highlight real world examples that reap the benefits of leakage power reduction solutions. Finally, the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element COMPUTER HARDWARE.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element COMPUTER AIDED DESIGN.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONICS.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element SYSTEMS ENGINEERING.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element NANOTECHNOLOGY.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ENGINEERING.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CIRCUITS AND SYSTEMS.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element COMPUTER-AIDED ENGINEERING (CAD, CAE) AND DESIGN.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONICS AND MICROELECTRONICS, INSTRUMENTATION.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element COMPUTER HARDWARE.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONIC AND COMPUTER ENGINEERING.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element NANOTECHNOLOGY.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Chandrakasan, Anantha.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9780387257372
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Series on Integrated Circuits and Systems,
International Standard Serial Number 1558-9412
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1007/0-387-28133-9">http://dx.doi.org/10.1007/0-387-28133-9</a>
Public note Ver el texto completo en las instalaciones del CICY
912 ## -
-- ZDB-2-ENG
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Libros electrónicos
Holdings
Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Total checkouts Full call number Date last seen Price effective from Koha item type
  Dewey Decimal Classification     Libro electrónico CICY CICY Libro electrónico 10.07.2025   621.3815 10.07.2025 10.07.2025 Libros electrónicos