Scanning Microscopy for Nanotechnology (Record no. 57631)

MARC details
000 -LEADER
fixed length control field 03484nam a22004575i 4500
001 - CONTROL NUMBER
control field 978-0-387-39620-0
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250710083959.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2007 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780387396200
-- 99780387396200
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-0-387-39620-0
Source of number or code doi
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.115
Edition information 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Zhou, Weilie.
Relator term editor.
245 10 - TITLE STATEMENT
Title Scanning Microscopy for Nanotechnology
Medium [recurso electrónico] :
Remainder of title Techniques and Applications /
Statement of responsibility, etc. edited by Weilie Zhou, Zhong Lin Wang.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New York, NY :
Name of producer, publisher, distributor, manufacturer Springer New York,
Date of production, publication, distribution, manufacture, or copyright notice 2007.
300 ## - PHYSICAL DESCRIPTION
Extent XIV, 522 p.
Other physical details online resource.
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term recurso en línea
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type text file
Encoding format PDF
Source rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Fundamentals of Scanning Electron Microscopy (SEM) -- Backscattering Detector and EBSD in Nanomaterials Characterization -- X-ray Microanalysis in Nanomaterials -- Low kV Scanning Electron Microscopy -- E-beam Nanolithography Integrated with Scanning Electron Microscope -- Scanning Transmission Electron Microscopy for Nanostructure Characterization -- to In-Situ Nanomanipulation for Nanomaterials Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes -- Photonic Crystals and Devices -- Nanoparticles and Colloidal Self-assembly -- Nano-building Blocks Fabricated through Templates -- One-dimensional Wurtzite Semiconducting Nanostructures -- Bio-inspired Nanomaterials -- Cryo-Temperature Stages in Nanostructural Research.
520 ## - SUMMARY, ETC.
Summary, etc. Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CHEMISTRY.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element OPTICAL MATERIALS.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element NANOTECHNOLOGY.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element SURFACES (PHYSICS).
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CHEMISTRY.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element NANOTECHNOLOGY.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element CHARACTERIZATION AND EVALUATION OF MATERIALS.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element OPTICAL AND ELECTRONIC MATERIALS.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element MEASUREMENT SCIENCE AND INSTRUMENTATION.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wang, Zhong Lin.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed edition:
International Standard Book Number 9780387333250
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1007/978-0-387-39620-0">http://dx.doi.org/10.1007/978-0-387-39620-0</a>
Public note Ver el texto completo en las instalaciones del CICY
912 ## -
-- ZDB-2-CMS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Libros electrónicos
Holdings
Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Total checkouts Full call number Date last seen Price effective from Koha item type
  Dewey Decimal Classification     Libro electrónico CICY CICY Libro electrónico 10.07.2025   620.115 10.07.2025 10.07.2025 Libros electrónicos