Scanning Microscopy for Nanotechnology [recurso electrónico] : Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.

Fundamentals of Scanning Electron Microscopy (SEM) -- Backscattering Detector and EBSD in Nanomaterials Characterization -- X-ray Microanalysis in Nanomaterials -- Low kV Scanning Electron Microscopy -- E-beam Nanolithography Integrated with Scanning Electron Microscope -- Scanning Transmission Electron Microscopy for Nanostructure Characterization -- to In-Situ Nanomanipulation for Nanomaterials Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes -- Photonic Crystals and Devices -- Nanoparticles and Colloidal Self-assembly -- Nano-building Blocks Fabricated through Templates -- One-dimensional Wurtzite Semiconducting Nanostructures -- Bio-inspired Nanomaterials -- Cryo-Temperature Stages in Nanostructural Research.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.