MARC details
| 000 -LEADER |
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| fixed length control field |
01793nam a2200253Ia 4500 |
| 001 - CONTROL NUMBER |
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| control field |
000009329 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
MX-MdCICY |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20241009164555.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
170516t----2015mx-a###f#p---#000-0#eng-# |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9789814303590 Hardcover |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
CICY |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
548.83 |
| Item number |
X73 2015 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
X-ray diffraction : |
| Remainder of title |
modern experimental techniques / |
| Statement of responsibility, etc. |
edited by Oliver H. Seeck, Bridget M. Murphy |
| 264 31 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Singapore : |
| Name of producer, publisher, distributor, manufacturer |
Pan Stanford Publishing, |
| Date of production, publication, distribution, manufacture, or copyright notice |
c2015 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xv, 427 p. : |
| Other physical details |
il. ; |
| Dimensions |
23 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Incluye referencias bibliográficas e índice |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Contenido: An Overview of X-Ray Scattering and Diffraction Theory and Techniques, Oliver H. Seeck Scattering and Diffraction Beamlines at Synchrotron Radiation Sources, Oliver H. Seeck Micro- and Nano-diffraction, Christina Krywka and Martin Mueller Small-Angle X-Ray Scattering, Ulla Vainio The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity, Jorg Zegenhagen Inelastic X-Ray Scattering from Phonons, Alexej Bosak and Michael Krisch Magnetic X-Ray Scattering, Steve Collins Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism, Ralf Rohlsberger Reflectivity at Liquid Interfaces, Bridget M. Murphy X-Ray Diffraction at Extreme Conditions: Today and Tomorrow, Hanns-Peter Liermann Synchrotron Tomography, Astrid Haibel Coherent X-Ray Diffraction Imaging of Nanostructures, Ivan Vartanyants and Oleksandr Yefanov X-Ray Photon Correlation Spectroscopy, Christian Gutt and Michael Sprung. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
DIFRACCION DE RAYOS X |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
RADIOGRAFIA |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Murphy, Bridget M., |
| Relator term |
ed. |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Seeck, Oliver H., |
| Relator term |
ed. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://www.cicy.mx/sitios/sib/doctoelectronico/9329.pdf">https://www.cicy.mx/sitios/sib/doctoelectronico/9329.pdf</a> |
| Public note |
Ver tabla de contenido y/o resumen |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Libros impresos |
