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X-ray diffraction : modern experimental techniques / edited by Oliver H. Seeck, Bridget M. Murphy

Tipo de material: TextoTextoEditor: Singapore : Pan Stanford Publishing, c2015Descripción: xv, 427 p. : il. ; 23 cmISBN:
  • 9789814303590 Hardcover
Trabajos contenidos:
  • Murphy, Bridget M [ed.]
  • Seeck, Oliver H [ed.]
Tema(s): Clasificación CDD:
  • 548.83 X73 2015
Recursos en línea:
Contenidos:
Contenido: An Overview of X-Ray Scattering and Diffraction Theory and Techniques, Oliver H. Seeck Scattering and Diffraction Beamlines at Synchrotron Radiation Sources, Oliver H. Seeck Micro- and Nano-diffraction, Christina Krywka and Martin Mueller Small-Angle X-Ray Scattering, Ulla Vainio The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity, Jorg Zegenhagen Inelastic X-Ray Scattering from Phonons, Alexej Bosak and Michael Krisch Magnetic X-Ray Scattering, Steve Collins Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism, Ralf Rohlsberger Reflectivity at Liquid Interfaces, Bridget M. Murphy X-Ray Diffraction at Extreme Conditions: Today and Tomorrow, Hanns-Peter Liermann Synchrotron Tomography, Astrid Haibel Coherent X-Ray Diffraction Imaging of Nanostructures, Ivan Vartanyants and Oleksandr Yefanov X-Ray Photon Correlation Spectroscopy, Christian Gutt and Michael Sprung.
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Holdings
Item type Current library Collection Call number Status Date due Barcode
Libros impresos Libros impresos CICY Colección general Colección general 548.83 X73 2015 (Browse shelf(Opens below)) Available 9211
Libros impresos Libros impresos CICY Colección general Colección general 548.83 X73 2015 (Browse shelf(Opens below)) Available 9497

Incluye referencias bibliográficas e índice

Contenido: An Overview of X-Ray Scattering and Diffraction Theory and Techniques, Oliver H. Seeck Scattering and Diffraction Beamlines at Synchrotron Radiation Sources, Oliver H. Seeck Micro- and Nano-diffraction, Christina Krywka and Martin Mueller Small-Angle X-Ray Scattering, Ulla Vainio The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity, Jorg Zegenhagen Inelastic X-Ray Scattering from Phonons, Alexej Bosak and Michael Krisch Magnetic X-Ray Scattering, Steve Collins Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism, Ralf Rohlsberger Reflectivity at Liquid Interfaces, Bridget M. Murphy X-Ray Diffraction at Extreme Conditions: Today and Tomorrow, Hanns-Peter Liermann Synchrotron Tomography, Astrid Haibel Coherent X-Ray Diffraction Imaging of Nanostructures, Ivan Vartanyants and Oleksandr Yefanov X-Ray Photon Correlation Spectroscopy, Christian Gutt and Michael Sprung.

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