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Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; foreward by T.E. Evenhart

Por: Tipo de material: TextoTextoEditor: New York : Plenum Press, 1975Descripción: xvii, 582 p. : il. ; 22 cmISBN:
  • 0306308207
Trabajos contenidos:
  • Yakowitz, Harvey
Tema(s): Clasificación CDD:
  • 502.825 G64p
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