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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico / R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering por
Tipo de material:  Texto; Formato:
impreso ; Forma literaria:
No es ficción Editor: Bellingham, Wash. : SPIE, c2005
Disponibilidad: Ítems disponibles para préstamo: CICY (1)Colección, signatura topográfica: Colección general 621.366 I5 2005.
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