Scanning electron microscopy and x-ray microanalysis /
Scanning electron microscopy and x-ray microanalysis /
Joseph I. Goldstein ... [et al.]
- 3 ed.
- xix, 689 p. : il. ; 26 cm. + 1 CD-ROM (4 3/4 pulgadas)
Incluye referencias bibliográficas e índice
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
0306472929
MICROSCOPIOS DE RAYOS X
MICROSCOPIOS ELECTRONICOS--BARRIDO
502.825 / S2 2003
Incluye referencias bibliográficas e índice
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
0306472929
MICROSCOPIOS DE RAYOS X
MICROSCOPIOS ELECTRONICOS--BARRIDO
502.825 / S2 2003