MARC details
| 000 -LEADER |
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| fixed length control field |
01489nam a2200253Ia 4500 |
| 001 - CONTROL NUMBER |
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| control field |
000004516 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
MX-MdCICY |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20241009163732.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
300314t----2003nyua###f#p---#000-0#ENG-# |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0306472929 |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
CICY |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.825 |
| Item number |
S2 2003 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Scanning electron microscopy and x-ray microanalysis / |
| Statement of responsibility, etc. |
Joseph I. Goldstein ... [et al.] |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
3 ed. |
| 264 31 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
New York, NY : |
| Name of producer, publisher, distributor, manufacturer |
Kluwer Academic/Plenum Publishers, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2003 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xix, 689 p. : |
| Other physical details |
il. ; |
| Dimensions |
26 cm. + 1 CD-ROM (4 3/4 pulgadas) |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Incluye referencias bibliográficas e índice |
| 520 3# - SUMMARY, ETC. |
|---|
| Summary, etc. |
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
MICROSCOPIOS DE RAYOS X |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
MICROSCOPIOS ELECTRONICOS |
| General subdivision |
BARRIDO |
| 700 12 - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Goldstein, Joseph I |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://www.cicy.mx/sitios/sib/doctoelectronico/4516.pdf">https://www.cicy.mx/sitios/sib/doctoelectronico/4516.pdf</a> |
| Public note |
Ver tabla de contenido y/o resumen |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Libros impresos |
