Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]
Tipo de material:
TextoEditor: New York, NY : Kluwer Academic/Plenum Publishers, 2003Edición: 3 edDescripción: xix, 689 p. : il. ; 26 cm. + 1 CD-ROM (4 3/4 pulgadas)ISBN: - 0306472929
- Goldstein, Joseph I
- 502.825 S2 2003
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
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CICY Colección general | Colección general | 502.825 S2 2003 (Browse shelf(Opens below)) | Available | 6346 | |||
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CICY Colección general | Colección general | 502.825 S2 2003 (Browse shelf(Opens below)) | Ej.2 | Available | 8337 | ||
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Libros impresos
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CICY Colección general | Colección general | 502.825 S2 2003 (Browse shelf(Opens below)) | Ej.3 | Available | 8403 |
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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